Microanalysis of oxygen isotopes in insulators by secondary ion mass spectrometry
- DOI
- 10.1016/0168-1176(92)80051-2
- Published
- 1992-10
- Container
- International Journal of Mass Spectrometry and Ion Processes
- Publisher
- Elsevier BV
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1016/0168-1176-92-80051-2,
title = {Microanalysis of oxygen isotopes in insulators by secondary ion mass spectrometry},
author = {Richard L. Hervig and Peter Williams and Robert M. Thomas and Stephen N. Schauer and Ian M. Steele},
year = {1992},
journal = {International Journal of Mass Spectrometry and Ion Processes},
doi = {10.1016/0168-1176(92)80051-2},
url = {https://doi.org/10.1016/0168-1176(92)80051-2}
}RIS
TY - JOUR TI - Microanalysis of oxygen isotopes in insulators by secondary ion mass spectrometry AU - Richard L. Hervig AU - Peter Williams AU - Robert M. Thomas AU - Stephen N. Schauer AU - Ian M. Steele PY - 1992 JO - International Journal of Mass Spectrometry and Ion Processes DO - 10.1016/0168-1176(92)80051-2 UR - https://doi.org/10.1016/0168-1176(92)80051-2 ER -
APA
Hervig, R. L., Williams, P., Thomas, R. M., Schauer, S. N., & Steele, I. M. (1992). Microanalysis of oxygen isotopes in insulators by secondary ion mass spectrometry. International Journal of Mass Spectrometry and Ion Processes. https://doi.org/10.1016/0168-1176(92)80051-2
Source records
- crossref · retrieved 2026-09-25T18:21:27.703Z