Reliability of laser diodes for high-rate optical communications – A Monte Carlo-based method to predict lifetime distributions and failure rates in operating conditions

Laurent Mendizabal, Frederic Verdier, Yannick Deshayes, Yves Ousten, Yves Danto, Laurent Béchou

Open source

DOI
10.1016/b978-1-78548-154-3.50003-3
Published
2021
Container
Not recorded
Publisher
Elsevier
Open access
no

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BibTeX

@article{allodium:10.1016/b978-1-78548-154-3.50003-3,
  title = {Reliability of laser diodes for high-rate optical communications – A Monte Carlo-based method to predict lifetime distributions and failure rates in operating conditions},
  author = {Laurent Mendizabal and Frederic Verdier and Yannick Deshayes and Yves Ousten and Yves Danto and Laurent Béchou},
  year = {2021},
  doi = {10.1016/b978-1-78548-154-3.50003-3},
  url = {https://doi.org/10.1016/b978-1-78548-154-3.50003-3}
}

RIS

TY  - JOUR
TI  - Reliability of laser diodes for high-rate optical communications – A Monte Carlo-based method to predict lifetime distributions and failure rates in operating conditions
AU  - Laurent Mendizabal
AU  - Frederic Verdier
AU  - Yannick Deshayes
AU  - Yves Ousten
AU  - Yves Danto
AU  - Laurent Béchou
PY  - 2021
DO  - 10.1016/b978-1-78548-154-3.50003-3
UR  - https://doi.org/10.1016/b978-1-78548-154-3.50003-3
ER  - 

APA

Mendizabal, L., Verdier, F., Deshayes, Y., Ousten, Y., Danto, Y., & Béchou, L. (2021). Reliability of laser diodes for high-rate optical communications – A Monte Carlo-based method to predict lifetime distributions and failure rates in operating conditions. https://doi.org/10.1016/b978-1-78548-154-3.50003-3

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