Reliability of Laser Diodes for High-rate Optical Communications – A Monte Carlo-based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions
- DOI
- 10.1016/b978-1-78548-154-3.50003-3
- Published
- 2021
- Container
- Advanced Laser Diode Reliability
- Publisher
- Elsevier
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1016/b978-1-78548-154-3.50003-3,
title = {Reliability of Laser Diodes for High-rate Optical Communications – A Monte Carlo-based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions},
author = {Laurent Mendizabal and Frédéric Verdier and Yannick Deshayes and Yves Ousten and Yves Danto and Laurent Béchou},
year = {2021},
journal = {Advanced Laser Diode Reliability},
doi = {10.1016/b978-1-78548-154-3.50003-3},
url = {https://doi.org/10.1016/b978-1-78548-154-3.50003-3}
}RIS
TY - JOUR TI - Reliability of Laser Diodes for High-rate Optical Communications – A Monte Carlo-based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions AU - Laurent Mendizabal AU - Frédéric Verdier AU - Yannick Deshayes AU - Yves Ousten AU - Yves Danto AU - Laurent Béchou PY - 2021 JO - Advanced Laser Diode Reliability DO - 10.1016/b978-1-78548-154-3.50003-3 UR - https://doi.org/10.1016/b978-1-78548-154-3.50003-3 ER -
APA
Mendizabal, L., Verdier, F., Deshayes, Y., Ousten, Y., Danto, Y., & Béchou, L. (2021). Reliability of Laser Diodes for High-rate Optical Communications – A Monte Carlo-based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions. Advanced Laser Diode Reliability. https://doi.org/10.1016/b978-1-78548-154-3.50003-3
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- crossref · retrieved 2026-11-10T16:42:34.919Z