Reliability modeling and statistical analysis of accelerated degradation process with memory effects and unit-to-unit variability

Shi-Shun Chen, Xiao-Yang Li, Wen-Rui Xie

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DOI: 10.1016/j.apm.2024.115788
Published: 2025-02
Container: Applied Mathematical Modelling
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/j.apm.2024.115788,
  title = {Reliability modeling and statistical analysis of accelerated degradation process with memory effects and unit-to-unit variability},
  author = {Shi-Shun Chen and Xiao-Yang Li and Wen-Rui Xie},
  year = {2025},
  journal = {Applied Mathematical Modelling},
  doi = {10.1016/j.apm.2024.115788},
  url = {https://doi.org/10.1016/j.apm.2024.115788}
}

RIS

TY  - JOUR
TI  - Reliability modeling and statistical analysis of accelerated degradation process with memory effects and unit-to-unit variability
AU  - Shi-Shun Chen
AU  - Xiao-Yang Li
AU  - Wen-Rui Xie
PY  - 2025
JO  - Applied Mathematical Modelling
DO  - 10.1016/j.apm.2024.115788
UR  - https://doi.org/10.1016/j.apm.2024.115788
ER  -

APA

Chen, S., Li, X., & Xie, W. (2025). Reliability modeling and statistical analysis of accelerated degradation process with memory effects and unit-to-unit variability. Applied Mathematical Modelling. https://doi.org/10.1016/j.apm.2024.115788

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crossref · retrieved 2026-09-26T05:45:35.827Z