RETRACTED: Spectral diffuse reflectance measurements of gadolinia, silica thin film systems using synchrotron radiation
- DOI
- 10.1016/j.apsusc.2006.10.032
- Published
- 2007-03
- Container
- Applied Surface Science
- Publisher
- Elsevier BV
- Open access
- unknown
Credibility signals
serious concern Score 29/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
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Cite this work
BibTeX
@article{allodium:10.1016/j.apsusc.2006.10.032,
title = {RETRACTED: Spectral diffuse reflectance measurements of gadolinia, silica thin film systems using synchrotron radiation},
author = {N.K. Sahoo and S. Thakur and R.B. Tokas and B.N. Raja Sekhar},
year = {2007},
journal = {Applied Surface Science},
doi = {10.1016/j.apsusc.2006.10.032},
url = {https://doi.org/10.1016/j.apsusc.2006.10.032}
}RIS
TY - JOUR TI - RETRACTED: Spectral diffuse reflectance measurements of gadolinia, silica thin film systems using synchrotron radiation AU - N.K. Sahoo AU - S. Thakur AU - R.B. Tokas AU - B.N. Raja Sekhar PY - 2007 JO - Applied Surface Science DO - 10.1016/j.apsusc.2006.10.032 UR - https://doi.org/10.1016/j.apsusc.2006.10.032 ER -
APA
Sahoo, N., Thakur, S., Tokas, R., & Sekhar, B. R. (2007). RETRACTED: Spectral diffuse reflectance measurements of gadolinia, silica thin film systems using synchrotron radiation. Applied Surface Science. https://doi.org/10.1016/j.apsusc.2006.10.032
Source records
- crossref · retrieved 2026-09-25T02:27:40.608Z