Monitoring silver solid-state dewetting with in situ ellipsometry

P. Jacquet, M. Kildemo, J. Teisseire, I. Gozhyk, J. Jupille, R. Lazzari

Open source

DOI: 10.1016/j.apsusc.2016.10.160
Published: 2017-11
Container: Applied Surface Science
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/j.apsusc.2016.10.160,
  title = {Monitoring silver solid-state dewetting with in situ ellipsometry},
  author = {P. Jacquet and M. Kildemo and J. Teisseire and I. Gozhyk and J. Jupille and R. Lazzari},
  year = {2017},
  journal = {Applied Surface Science},
  doi = {10.1016/j.apsusc.2016.10.160},
  url = {https://doi.org/10.1016/j.apsusc.2016.10.160}
}

RIS

TY  - JOUR
TI  - Monitoring silver solid-state dewetting with in situ ellipsometry
AU  - P. Jacquet
AU  - M. Kildemo
AU  - J. Teisseire
AU  - I. Gozhyk
AU  - J. Jupille
AU  - R. Lazzari
PY  - 2017
JO  - Applied Surface Science
DO  - 10.1016/j.apsusc.2016.10.160
UR  - https://doi.org/10.1016/j.apsusc.2016.10.160
ER  -

APA

Jacquet, P., Kildemo, M., Teisseire, J., Gozhyk, I., Jupille, J., & Lazzari, R. (2017). Monitoring silver solid-state dewetting with in situ ellipsometry. Applied Surface Science. https://doi.org/10.1016/j.apsusc.2016.10.160

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crossref · retrieved 2026-11-10T07:06:57.961Z