Atomic-scale characterization of defects in oxygen plasma-treated graphene by scanning tunneling microscopy
- DOI
- 10.1016/j.carbon.2024.119260
- Published
- 2024-06
- Container
- Carbon
- Publisher
- Elsevier BV
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1016/j.carbon.2024.119260,
title = {Atomic-scale characterization of defects in oxygen plasma-treated graphene by scanning tunneling microscopy},
author = {Van Dong Pham and César González and Yannick J. Dappe and Chengye Dong and Joshua A. Robinson and Achim Trampert and Roman Engel-Herbert},
year = {2024},
journal = {Carbon},
doi = {10.1016/j.carbon.2024.119260},
url = {https://doi.org/10.1016/j.carbon.2024.119260}
}RIS
TY - JOUR TI - Atomic-scale characterization of defects in oxygen plasma-treated graphene by scanning tunneling microscopy AU - Van Dong Pham AU - César González AU - Yannick J. Dappe AU - Chengye Dong AU - Joshua A. Robinson AU - Achim Trampert AU - Roman Engel-Herbert PY - 2024 JO - Carbon DO - 10.1016/j.carbon.2024.119260 UR - https://doi.org/10.1016/j.carbon.2024.119260 ER -
APA
Pham, V. D., González, C., Dappe, Y. J., Dong, C., Robinson, J. A., Trampert, A., & Engel-Herbert, R. (2024). Atomic-scale characterization of defects in oxygen plasma-treated graphene by scanning tunneling microscopy. Carbon. https://doi.org/10.1016/j.carbon.2024.119260
Source records
- crossref · retrieved 2026-11-07T09:11:17.107Z