Seeing and measuring with electrons: Transmission electron microscopy today and tomorrow – An introduction

Christian Colliex

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DOI: 10.1016/j.crhy.2014.02.001
Published: 2014-02-01
Container: Comptes Rendus. Physique
Publisher: MathDoc/Centre Mersenne
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/j.crhy.2014.02.001,
  title = {Seeing and measuring with electrons: Transmission electron microscopy today and tomorrow – An introduction},
  author = {Christian Colliex},
  year = {2014},
  journal = {Comptes Rendus. Physique},
  doi = {10.1016/j.crhy.2014.02.001},
  url = {https://doi.org/10.1016/j.crhy.2014.02.001}
}

RIS

TY  - JOUR
TI  - Seeing and measuring with electrons: Transmission electron microscopy today and tomorrow – An introduction
AU  - Christian Colliex
PY  - 2014
JO  - Comptes Rendus. Physique
DO  - 10.1016/j.crhy.2014.02.001
UR  - https://doi.org/10.1016/j.crhy.2014.02.001
ER  -

APA

Colliex, C. (2014). Seeing and measuring with electrons: Transmission electron microscopy today and tomorrow – An introduction. Comptes Rendus. Physique. https://doi.org/10.1016/j.crhy.2014.02.001

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crossref · retrieved 2026-09-25T07:27:42.183Z