DRIFT-EM enables direct wafer retrieval of ultrathin serial sections for large-volume electron microscopy.
- DOI
- 10.1016/j.crmeth.2026.101429
- Published
- 2026 Jun 15
- Container
- Cell reports methods
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.1016/j.crmeth.2026.101429,
title = {DRIFT-EM enables direct wafer retrieval of ultrathin serial sections for large-volume electron microscopy.},
author = {Medina N and Gogola JV and Boergens K and Yang F and Meirovitch Y and Lichtman JW and Kasthuri N and Wildenberg G},
year = {2026},
journal = {Cell reports methods},
doi = {10.1016/j.crmeth.2026.101429},
url = {https://doi.org/10.1016/j.crmeth.2026.101429}
}RIS
TY - JOUR TI - DRIFT-EM enables direct wafer retrieval of ultrathin serial sections for large-volume electron microscopy. AU - Medina N AU - Gogola JV AU - Boergens K AU - Yang F AU - Meirovitch Y AU - Lichtman JW AU - Kasthuri N AU - Wildenberg G PY - 2026 JO - Cell reports methods DO - 10.1016/j.crmeth.2026.101429 UR - https://doi.org/10.1016/j.crmeth.2026.101429 ER -
APA
N, M., JV, G., K, B., F, Y., Y, M., JW, L., N, K., & G, W. (2026). DRIFT-EM enables direct wafer retrieval of ultrathin serial sections for large-volume electron microscopy.. Cell reports methods. https://doi.org/10.1016/j.crmeth.2026.101429
Source records
- pubmed · retrieved 2026-09-27T11:57:55.677Z