Low-temperature low-cost 58 Bismuth – 42 Tin alloy forensic chip re-balling and re-soldering

Thibaut Heckmann, Th. Heckmann, Th. Souvignet, S. Lepeer, D. Naccache

Open source

DOI
10.1016/j.diin.2016.10.003
Published
2016-12
Container
Digital Investigation
Publisher
Not recorded
Open access
no

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BibTeX

@article{allodium:10.1016/j.diin.2016.10.003,
  title = {Low-temperature low-cost 58 Bismuth – 42 Tin alloy forensic chip re-balling and re-soldering},
  author = {Thibaut Heckmann and Th. Heckmann and Th. Souvignet and S. Lepeer and D. Naccache},
  year = {2016},
  journal = {Digital Investigation},
  doi = {10.1016/j.diin.2016.10.003},
  url = {https://doi.org/10.1016/j.diin.2016.10.003}
}

RIS

TY  - JOUR
TI  - Low-temperature low-cost 58 Bismuth – 42 Tin alloy forensic chip re-balling and re-soldering
AU  - Thibaut Heckmann
AU  - Th. Heckmann
AU  - Th. Souvignet
AU  - S. Lepeer
AU  - D. Naccache
PY  - 2016
JO  - Digital Investigation
DO  - 10.1016/j.diin.2016.10.003
UR  - https://doi.org/10.1016/j.diin.2016.10.003
ER  - 

APA

Heckmann, T., Heckmann, T., Souvignet, T., Lepeer, S., & Naccache, D. (2016). Low-temperature low-cost 58 Bismuth – 42 Tin alloy forensic chip re-balling and re-soldering. Digital Investigation. https://doi.org/10.1016/j.diin.2016.10.003

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