Development of a Process Analytical Technology (PAT) for in-line monitoring of film thickness and mass of coating materials during a pan coating operation

Claire Gendre, Muriel Genty, Mathieu Boiret, Marc Julien, Loïc Meunier, Olivier Lecoq, Michel Baron, Pierre Chaminade, Jean Manuel Péan

Open source

DOI
10.1016/j.ejps.2011.04.017
Published
2011-07
Container
European Journal of Pharmaceutical Sciences
Publisher
Elsevier BV
Open access
unknown

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BibTeX

@article{allodium:10.1016/j.ejps.2011.04.017,
  title = {Development of a Process Analytical Technology (PAT) for in-line monitoring of film thickness and mass of coating materials during a pan coating operation},
  author = {Claire Gendre and Muriel Genty and Mathieu Boiret and Marc Julien and Loïc Meunier and Olivier Lecoq and Michel Baron and Pierre Chaminade and Jean Manuel Péan},
  year = {2011},
  journal = {European Journal of Pharmaceutical Sciences},
  doi = {10.1016/j.ejps.2011.04.017},
  url = {https://doi.org/10.1016/j.ejps.2011.04.017}
}

RIS

TY  - JOUR
TI  - Development of a Process Analytical Technology (PAT) for in-line monitoring of film thickness and mass of coating materials during a pan coating operation
AU  - Claire Gendre
AU  - Muriel Genty
AU  - Mathieu Boiret
AU  - Marc Julien
AU  - Loïc Meunier
AU  - Olivier Lecoq
AU  - Michel Baron
AU  - Pierre Chaminade
AU  - Jean Manuel Péan
PY  - 2011
JO  - European Journal of Pharmaceutical Sciences
DO  - 10.1016/j.ejps.2011.04.017
UR  - https://doi.org/10.1016/j.ejps.2011.04.017
ER  - 

APA

Gendre, C., Genty, M., Boiret, M., Julien, M., Meunier, L., Lecoq, O., Baron, M., Chaminade, P., & Péan, J. M. (2011). Development of a Process Analytical Technology (PAT) for in-line monitoring of film thickness and mass of coating materials during a pan coating operation. European Journal of Pharmaceutical Sciences. https://doi.org/10.1016/j.ejps.2011.04.017

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