Relatedness of the incidence decay with exponential adjustment (IDEA) model, "Farr's law" and SIR compartmental difference equation models.

Santillana M, Tuite A, Nasserie T, Fine P, Champredon D, Chindelevitch L, Dushoff J, Fisman D.

Open source

DOI
10.1016/j.idm.2018.03.001
Published
2018-03-09
Container
Infect Dis Model
Publisher
Not recorded
Open access
yes

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BibTeX

@article{allodium:10.1016/j.idm.2018.03.001,
  title = {Relatedness of the incidence decay with exponential adjustment (IDEA) model, "Farr's law" and SIR compartmental difference equation models.},
  author = {Santillana M and  Tuite A and  Nasserie T and  Fine P and  Champredon D and  Chindelevitch L and  Dushoff J and  Fisman D.},
  year = {2018},
  journal = {Infect Dis Model},
  doi = {10.1016/j.idm.2018.03.001},
  url = {https://doi.org/10.1016/j.idm.2018.03.001}
}

RIS

TY  - JOUR
TI  - Relatedness of the incidence decay with exponential adjustment (IDEA) model, "Farr's law" and SIR compartmental difference equation models.
AU  - Santillana M
AU  -  Tuite A
AU  -  Nasserie T
AU  -  Fine P
AU  -  Champredon D
AU  -  Chindelevitch L
AU  -  Dushoff J
AU  -  Fisman D.
PY  - 2018
JO  - Infect Dis Model
DO  - 10.1016/j.idm.2018.03.001
UR  - https://doi.org/10.1016/j.idm.2018.03.001
ER  -

APA

M, S., A, T., T, N., P, F., D, C., L, C., J, D., & D., F. (2018). Relatedness of the incidence decay with exponential adjustment (IDEA) model, "Farr's law" and SIR compartmental difference equation models.. Infect Dis Model. https://doi.org/10.1016/j.idm.2018.03.001

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