Bi-LSTM based fault diagnosis scheme having high accuracy for Medium-Voltage Direct Current systems using pre- and post-processing

Jae-Sung Lim, Haesong Cho, Do-Hoon Kwon, Gyu-Sub Lee

Open source

DOI
10.1016/j.ijepes.2025.110793
Published
2025-08
Container
International Journal of Electrical Power & Energy Systems
Publisher
Elsevier BV
Open access
unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

Cite this work

BibTeX

@article{allodium:10.1016/j.ijepes.2025.110793,
  title = {Bi-LSTM based fault diagnosis scheme having high accuracy for Medium-Voltage Direct Current systems using pre- and post-processing},
  author = {Jae-Sung Lim and Haesong Cho and Do-Hoon Kwon and Gyu-Sub Lee},
  year = {2025},
  journal = {International Journal of Electrical Power \& Energy Systems},
  doi = {10.1016/j.ijepes.2025.110793},
  url = {https://doi.org/10.1016/j.ijepes.2025.110793}
}

RIS

TY  - JOUR
TI  - Bi-LSTM based fault diagnosis scheme having high accuracy for Medium-Voltage Direct Current systems using pre- and post-processing
AU  - Jae-Sung Lim
AU  - Haesong Cho
AU  - Do-Hoon Kwon
AU  - Gyu-Sub Lee
PY  - 2025
JO  - International Journal of Electrical Power & Energy Systems
DO  - 10.1016/j.ijepes.2025.110793
UR  - https://doi.org/10.1016/j.ijepes.2025.110793
ER  - 

APA

Lim, J., Cho, H., Kwon, D., & Lee, G. (2025). Bi-LSTM based fault diagnosis scheme having high accuracy for Medium-Voltage Direct Current systems using pre- and post-processing. International Journal of Electrical Power & Energy Systems. https://doi.org/10.1016/j.ijepes.2025.110793

Source records