Boosting fault localization of statements by combining topic modeling and Ochiai

Romain Vacheret, Francisca Pérez, Tewfik Ziadi, Lom Hillah

Open source

DOI: 10.1016/j.infsof.2024.107499
Published: 2024-09
Container: Information and Software Technology
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/j.infsof.2024.107499,
  title = {Boosting fault localization of statements by combining topic modeling and Ochiai},
  author = {Romain Vacheret and Francisca Pérez and Tewfik Ziadi and Lom Hillah},
  year = {2024},
  journal = {Information and Software Technology},
  doi = {10.1016/j.infsof.2024.107499},
  url = {https://doi.org/10.1016/j.infsof.2024.107499}
}

RIS

TY  - JOUR
TI  - Boosting fault localization of statements by combining topic modeling and Ochiai
AU  - Romain Vacheret
AU  - Francisca Pérez
AU  - Tewfik Ziadi
AU  - Lom Hillah
PY  - 2024
JO  - Information and Software Technology
DO  - 10.1016/j.infsof.2024.107499
UR  - https://doi.org/10.1016/j.infsof.2024.107499
ER  -

APA

Vacheret, R., Pérez, F., Ziadi, T., & Hillah, L. (2024). Boosting fault localization of statements by combining topic modeling and Ochiai. Information and Software Technology. https://doi.org/10.1016/j.infsof.2024.107499

Source records

crossref · retrieved 2026-09-24T16:36:38.829Z