An infrastructure for accurate characterization of single-event transients in digital circuits.

Savulimedu Veeravalli V, Polzer T, Schmid U, Steininger A, Hofbauer M, Schweiger K, Dietrich H, Schneider-Hornstein K, Zimmermann H, Voss KO, Merk B, Hajek M

Open source

DOI: 10.1016/j.micpro.2013.04.011
Published: 2013 Nov
Container: Microprocessors and microsystems
Publisher: Not recorded
Open access: yes

Credibility signals

limited evidence Score 45/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

cautionDOI registered: No matching Crossref record was present in this response. Source: Crossref; license: CC0 metadata
cautionDOI resolves: No matching Crossref record was present in this response. Source: Crossref; license: CC0 metadata
not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
supportingOpen access status: Normalized open-access status: open. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
cautionMetadata completeness: 5 of 6 scored descriptive metadata groups are present; missing fields increase uncertainty. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.1016/j.micpro.2013.04.011,
  title = {An infrastructure for accurate characterization of single-event transients in digital circuits.},
  author = {Savulimedu Veeravalli V and Polzer T and Schmid U and Steininger A and Hofbauer M and Schweiger K and Dietrich H and Schneider-Hornstein K and Zimmermann H and Voss KO and Merk B and Hajek M},
  year = {2013},
  journal = {Microprocessors and microsystems},
  doi = {10.1016/j.micpro.2013.04.011},
  url = {https://doi.org/10.1016/j.micpro.2013.04.011}
}

RIS

TY  - JOUR
TI  - An infrastructure for accurate characterization of single-event transients in digital circuits.
AU  - Savulimedu Veeravalli V
AU  - Polzer T
AU  - Schmid U
AU  - Steininger A
AU  - Hofbauer M
AU  - Schweiger K
AU  - Dietrich H
AU  - Schneider-Hornstein K
AU  - Zimmermann H
AU  - Voss KO
AU  - Merk B
AU  - Hajek M
PY  - 2013
JO  - Microprocessors and microsystems
DO  - 10.1016/j.micpro.2013.04.011
UR  - https://doi.org/10.1016/j.micpro.2013.04.011
ER  -

APA

V, S. V., T, P., U, S., A, S., M, H., K, S., H, D., K, S., H, Z., KO, V., B, M., & M, H. (2013). An infrastructure for accurate characterization of single-event transients in digital circuits.. Microprocessors and microsystems. https://doi.org/10.1016/j.micpro.2013.04.011

Source records

pubmed · retrieved 2026-11-10T09:15:37.051Z