Special issue: Quantitative and precise measurements in conventional (scanning) electron microscopy and electron tomography.
- DOI
- 10.1016/j.micron.2026.104050
- Published
- 2026 Sep
- Container
- Micron (Oxford, England : 1993)
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1016/j.micron.2026.104050,
title = {Special issue: Quantitative and precise measurements in conventional (scanning) electron microscopy and electron tomography.},
author = {Malac M and Harada K and Yaguchi T and Taniguchi Y and Yamasaki J and Howe J and Blackburn A and Motoki S and Konyuba Y},
year = {2026},
journal = {Micron (Oxford, England : 1993)},
doi = {10.1016/j.micron.2026.104050},
url = {https://doi.org/10.1016/j.micron.2026.104050}
}RIS
TY - JOUR TI - Special issue: Quantitative and precise measurements in conventional (scanning) electron microscopy and electron tomography. AU - Malac M AU - Harada K AU - Yaguchi T AU - Taniguchi Y AU - Yamasaki J AU - Howe J AU - Blackburn A AU - Motoki S AU - Konyuba Y PY - 2026 JO - Micron (Oxford, England : 1993) DO - 10.1016/j.micron.2026.104050 UR - https://doi.org/10.1016/j.micron.2026.104050 ER -
APA
M, M., K, H., T, Y., Y, T., J, Y., J, H., A, B., S, M., & Y, K. (2026). Special issue: Quantitative and precise measurements in conventional (scanning) electron microscopy and electron tomography.. Micron (Oxford, England : 1993). https://doi.org/10.1016/j.micron.2026.104050
Source records
- pubmed · retrieved 2026-09-26T06:53:09.358Z