Optical-feedback scanning ion conductance microscopy with high-speed and low-overshoot probe control.

Shi S, Wu W, Zheng Q, Zhang W, Yan H, Yang H, Zhuang J

DOI: 10.1016/j.micron.2026.104096
Published: 2026 Nov
Container: Micron (Oxford, England : 1993)
Publisher: Not recorded
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/j.micron.2026.104096,
  title = {Optical-feedback scanning ion conductance microscopy with high-speed and low-overshoot probe control.},
  author = {Shi S and Wu W and Zheng Q and Zhang W and Yan H and Yang H and Zhuang J},
  year = {2026},
  journal = {Micron (Oxford, England : 1993)},
  doi = {10.1016/j.micron.2026.104096},
  url = {https://doi.org/10.1016/j.micron.2026.104096}
}

RIS

TY  - JOUR
TI  - Optical-feedback scanning ion conductance microscopy with high-speed and low-overshoot probe control.
AU  - Shi S
AU  - Wu W
AU  - Zheng Q
AU  - Zhang W
AU  - Yan H
AU  - Yang H
AU  - Zhuang J
PY  - 2026
JO  - Micron (Oxford, England : 1993)
DO  - 10.1016/j.micron.2026.104096
UR  - https://doi.org/10.1016/j.micron.2026.104096
ER  -

APA

S, S., W, W., Q, Z., W, Z., H, Y., H, Y., & J, Z. (2026). Optical-feedback scanning ion conductance microscopy with high-speed and low-overshoot probe control.. Micron (Oxford, England : 1993). https://doi.org/10.1016/j.micron.2026.104096

Source records

pubmed · retrieved 2026-09-25T12:25:12.056Z