Reliability prediction with MTOL

Joseph B. Bernstein, Alain Bensoussan, Emmanuel Bender

Open source

DOI: 10.1016/j.microrel.2016.09.005
Published: 2017-01
Container: Microelectronics Reliability
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/j.microrel.2016.09.005,
  title = {Reliability prediction with MTOL},
  author = {Joseph B. Bernstein and Alain Bensoussan and Emmanuel Bender},
  year = {2017},
  journal = {Microelectronics Reliability},
  doi = {10.1016/j.microrel.2016.09.005},
  url = {https://doi.org/10.1016/j.microrel.2016.09.005}
}

RIS

TY  - JOUR
TI  - Reliability prediction with MTOL
AU  - Joseph B. Bernstein
AU  - Alain Bensoussan
AU  - Emmanuel Bender
PY  - 2017
JO  - Microelectronics Reliability
DO  - 10.1016/j.microrel.2016.09.005
UR  - https://doi.org/10.1016/j.microrel.2016.09.005
ER  -

APA

Bernstein, J. B., Bensoussan, A., & Bender, E. (2017). Reliability prediction with MTOL. Microelectronics Reliability. https://doi.org/10.1016/j.microrel.2016.09.005

Source records

crossref · retrieved 2026-09-24T22:32:04.523Z