RETRACTED: “A Probability Model of Covering Key Trace during Capturing Volatile Memory” Procedia Engineering Volume 29, 2012, Pages 1253–1258

Lianhai Wang, Hengjian Li, Zhen Su

DOI: 10.1016/j.proeng.2012.01.122
Published: 2012
Container: Procedia Engineering
Publisher: Elsevier BV
Open access: unknown

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serious concern Score 29/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

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Cite this work

BibTeX

@article{allodium:10.1016/j.proeng.2012.01.122,
  title = {RETRACTED: “A Probability Model of Covering Key Trace during Capturing Volatile Memory” Procedia Engineering Volume 29, 2012, Pages 1253–1258},
  author = {Lianhai Wang and Hengjian Li and Zhen Su},
  year = {2012},
  journal = {Procedia Engineering},
  doi = {10.1016/j.proeng.2012.01.122},
  url = {https://doi.org/10.1016/j.proeng.2012.01.122}
}

RIS

TY  - JOUR
TI  - RETRACTED: “A Probability Model of Covering Key Trace during Capturing Volatile Memory” Procedia Engineering Volume 29, 2012, Pages 1253–1258
AU  - Lianhai Wang
AU  - Hengjian Li
AU  - Zhen Su
PY  - 2012
JO  - Procedia Engineering
DO  - 10.1016/j.proeng.2012.01.122
UR  - https://doi.org/10.1016/j.proeng.2012.01.122
ER  -

APA

Wang, L., Li, H., & Su, Z. (2012). RETRACTED: “A Probability Model of Covering Key Trace during Capturing Volatile Memory” Procedia Engineering Volume 29, 2012, Pages 1253–1258. Procedia Engineering. https://doi.org/10.1016/j.proeng.2012.01.122

Source records

crossref · retrieved 2026-09-24T22:49:03.214Z