Accelerated degradation testing for lifetime analysis considering random effects and the influence of stress and measurement errors
- DOI
- 10.1016/j.ress.2024.110101
- Published
- 2024-07
- Container
- Reliability Engineering & System Safety
- Publisher
- Elsevier BV
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1016/j.ress.2024.110101,
title = {Accelerated degradation testing for lifetime analysis considering random effects and the influence of stress and measurement errors},
author = {Yang Li and Haifeng Gao and Hongtian Chen and Chun Liu and Zhe Yang and Enrico Zio},
year = {2024},
journal = {Reliability Engineering \& System Safety},
doi = {10.1016/j.ress.2024.110101},
url = {https://doi.org/10.1016/j.ress.2024.110101}
}RIS
TY - JOUR TI - Accelerated degradation testing for lifetime analysis considering random effects and the influence of stress and measurement errors AU - Yang Li AU - Haifeng Gao AU - Hongtian Chen AU - Chun Liu AU - Zhe Yang AU - Enrico Zio PY - 2024 JO - Reliability Engineering & System Safety DO - 10.1016/j.ress.2024.110101 UR - https://doi.org/10.1016/j.ress.2024.110101 ER -
APA
Li, Y., Gao, H., Chen, H., Liu, C., Yang, Z., & Zio, E. (2024). Accelerated degradation testing for lifetime analysis considering random effects and the influence of stress and measurement errors. Reliability Engineering & System Safety. https://doi.org/10.1016/j.ress.2024.110101
Source records
- crossref · retrieved 2026-09-25T16:49:32.145Z