Electromigration-guided composition patterns in thin alloy films: A computational study

Mikhail Khenner

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DOI: 10.1016/j.susc.2020.121611
Published: 2020-08
Container: Surface Science
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/j.susc.2020.121611,
  title = {Electromigration-guided composition patterns in thin alloy films: A computational study},
  author = {Mikhail Khenner},
  year = {2020},
  journal = {Surface Science},
  doi = {10.1016/j.susc.2020.121611},
  url = {https://doi.org/10.1016/j.susc.2020.121611}
}

RIS

TY  - JOUR
TI  - Electromigration-guided composition patterns in thin alloy films: A computational study
AU  - Mikhail Khenner
PY  - 2020
JO  - Surface Science
DO  - 10.1016/j.susc.2020.121611
UR  - https://doi.org/10.1016/j.susc.2020.121611
ER  -

APA

Khenner, M. (2020). Electromigration-guided composition patterns in thin alloy films: A computational study. Surface Science. https://doi.org/10.1016/j.susc.2020.121611

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crossref · retrieved 2026-09-25T17:04:35.500Z