Electrical detection of cisplatin-DNA adduct formation using dielectrophoresis-based impedance spectroscopy

Michihiko Nakano, Masafumi Inaba, Boonchai Techaumnat, Junya Suehiro

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DOI: 10.1016/j.talanta.2026.130268
Published: 2027-01
Container: Talanta
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/j.talanta.2026.130268,
  title = {Electrical detection of cisplatin-DNA adduct formation using dielectrophoresis-based impedance spectroscopy},
  author = {Michihiko Nakano and Masafumi Inaba and Boonchai Techaumnat and Junya Suehiro},
  year = {2027},
  journal = {Talanta},
  doi = {10.1016/j.talanta.2026.130268},
  url = {https://doi.org/10.1016/j.talanta.2026.130268}
}

RIS

TY  - JOUR
TI  - Electrical detection of cisplatin-DNA adduct formation using dielectrophoresis-based impedance spectroscopy
AU  - Michihiko Nakano
AU  - Masafumi Inaba
AU  - Boonchai Techaumnat
AU  - Junya Suehiro
PY  - 2027
JO  - Talanta
DO  - 10.1016/j.talanta.2026.130268
UR  - https://doi.org/10.1016/j.talanta.2026.130268
ER  -

APA

Nakano, M., Inaba, M., Techaumnat, B., & Suehiro, J. (2027). Electrical detection of cisplatin-DNA adduct formation using dielectrophoresis-based impedance spectroscopy. Talanta. https://doi.org/10.1016/j.talanta.2026.130268

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crossref · retrieved 2026-09-26T14:57:29.086Z