Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN.

Grieb T, Krause FF, Müller-Caspary K, Ahl JP, Schowalter M, Oppermann O, Hertkorn J, Engl K, Rosenauer A

Open source

DOI
10.1016/j.ultramic.2022.113535
Published
2022 Aug
Container
Ultramicroscopy
Publisher
Not recorded
Open access
no

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BibTeX

@article{allodium:10.1016/j.ultramic.2022.113535,
  title = {Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN.},
  author = {Grieb T and Krause FF and Müller-Caspary K and Ahl JP and Schowalter M and Oppermann O and Hertkorn J and Engl K and Rosenauer A},
  year = {2022},
  journal = {Ultramicroscopy},
  doi = {10.1016/j.ultramic.2022.113535},
  url = {https://doi.org/10.1016/j.ultramic.2022.113535}
}

RIS

TY  - JOUR
TI  - Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN.
AU  - Grieb T
AU  - Krause FF
AU  - Müller-Caspary K
AU  - Ahl JP
AU  - Schowalter M
AU  - Oppermann O
AU  - Hertkorn J
AU  - Engl K
AU  - Rosenauer A
PY  - 2022
JO  - Ultramicroscopy
DO  - 10.1016/j.ultramic.2022.113535
UR  - https://doi.org/10.1016/j.ultramic.2022.113535
ER  - 

APA

T, G., FF, K., K, M., JP, A., M, S., O, O., J, H., K, E., & A, R. (2022). Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN.. Ultramicroscopy. https://doi.org/10.1016/j.ultramic.2022.113535

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