Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN.
- DOI
- 10.1016/j.ultramic.2022.113535
- Published
- 2022 Aug
- Container
- Ultramicroscopy
- Publisher
- Not recorded
- Open access
- no
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Cite this work
BibTeX
@article{allodium:10.1016/j.ultramic.2022.113535,
title = {Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN.},
author = {Grieb T and Krause FF and Müller-Caspary K and Ahl JP and Schowalter M and Oppermann O and Hertkorn J and Engl K and Rosenauer A},
year = {2022},
journal = {Ultramicroscopy},
doi = {10.1016/j.ultramic.2022.113535},
url = {https://doi.org/10.1016/j.ultramic.2022.113535}
}RIS
TY - JOUR TI - Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN. AU - Grieb T AU - Krause FF AU - Müller-Caspary K AU - Ahl JP AU - Schowalter M AU - Oppermann O AU - Hertkorn J AU - Engl K AU - Rosenauer A PY - 2022 JO - Ultramicroscopy DO - 10.1016/j.ultramic.2022.113535 UR - https://doi.org/10.1016/j.ultramic.2022.113535 ER -
APA
T, G., FF, K., K, M., JP, A., M, S., O, O., J, H., K, E., & A, R. (2022). Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN.. Ultramicroscopy. https://doi.org/10.1016/j.ultramic.2022.113535
Source records
- pubmed · retrieved 2026-09-27T09:22:52.454Z
- europe-pmc · retrieved 2026-09-27T09:22:52.469Z