Fourier transform-based post-processing drift compensation and calibration method for scanning probe microscopy.

Le Ster M, Pawłowski S, Lutsyk I, Kowalczyk PJ

DOI: 10.1016/j.ultramic.2024.113984
Published: 2024 Sep
Container: Ultramicroscopy
Publisher: Not recorded
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/j.ultramic.2024.113984,
  title = {Fourier transform-based post-processing drift compensation and calibration method for scanning probe microscopy.},
  author = {Le Ster M and Pawłowski S and Lutsyk I and Kowalczyk PJ},
  year = {2024},
  journal = {Ultramicroscopy},
  doi = {10.1016/j.ultramic.2024.113984},
  url = {https://doi.org/10.1016/j.ultramic.2024.113984}
}

RIS

TY  - JOUR
TI  - Fourier transform-based post-processing drift compensation and calibration method for scanning probe microscopy.
AU  - Le Ster M
AU  - Pawłowski S
AU  - Lutsyk I
AU  - Kowalczyk PJ
PY  - 2024
JO  - Ultramicroscopy
DO  - 10.1016/j.ultramic.2024.113984
UR  - https://doi.org/10.1016/j.ultramic.2024.113984
ER  -

APA

M, L. S., S, P., I, L., & PJ, K. (2024). Fourier transform-based post-processing drift compensation and calibration method for scanning probe microscopy.. Ultramicroscopy. https://doi.org/10.1016/j.ultramic.2024.113984

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pubmed · retrieved 2026-09-26T21:50:20.124Z