Cryogenic sample preparation: Comparative analysis of Ga(+) and Xe(+) FIB milling for TEM and APT examination of zirconium.
- DOI
- 10.1016/j.ultramic.2025.114210
- Published
- 2025 Nov
- Container
- Ultramicroscopy
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1016/j.ultramic.2025.114210,
title = {Cryogenic sample preparation: Comparative analysis of Ga(+) and Xe(+) FIB milling for TEM and APT examination of zirconium.},
author = {Koç Ö and Jenkins BM and Haley J and Hofer C and Meier MS and Jones ME and Harrison RW and Preuss M and Moody MP and Grovenor CRM and Frankel P},
year = {2025},
journal = {Ultramicroscopy},
doi = {10.1016/j.ultramic.2025.114210},
url = {https://doi.org/10.1016/j.ultramic.2025.114210}
}RIS
TY - JOUR TI - Cryogenic sample preparation: Comparative analysis of Ga(+) and Xe(+) FIB milling for TEM and APT examination of zirconium. AU - Koç Ö AU - Jenkins BM AU - Haley J AU - Hofer C AU - Meier MS AU - Jones ME AU - Harrison RW AU - Preuss M AU - Moody MP AU - Grovenor CRM AU - Frankel P PY - 2025 JO - Ultramicroscopy DO - 10.1016/j.ultramic.2025.114210 UR - https://doi.org/10.1016/j.ultramic.2025.114210 ER -
APA
Ö, K., BM, J., J, H., C, H., MS, M., ME, J., RW, H., M, P., MP, M., CRM, G., & P, F. (2025). Cryogenic sample preparation: Comparative analysis of Ga(+) and Xe(+) FIB milling for TEM and APT examination of zirconium.. Ultramicroscopy. https://doi.org/10.1016/j.ultramic.2025.114210
Source records
- pubmed · retrieved 2026-09-27T15:58:57.219Z