Effect of accelerating voltages on indexing of SEM-EBSD via pattern matching

Tomotaka Hatakeyama, Kota Sawada

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DOI: 10.1016/j.ultramic.2026.114387
Published: 2026-07
Container: Ultramicroscopy
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/j.ultramic.2026.114387,
  title = {Effect of accelerating voltages on indexing of SEM-EBSD via pattern matching},
  author = {Tomotaka Hatakeyama and Kota Sawada},
  year = {2026},
  journal = {Ultramicroscopy},
  doi = {10.1016/j.ultramic.2026.114387},
  url = {https://doi.org/10.1016/j.ultramic.2026.114387}
}

RIS

TY  - JOUR
TI  - Effect of accelerating voltages on indexing of SEM-EBSD via pattern matching
AU  - Tomotaka Hatakeyama
AU  - Kota Sawada
PY  - 2026
JO  - Ultramicroscopy
DO  - 10.1016/j.ultramic.2026.114387
UR  - https://doi.org/10.1016/j.ultramic.2026.114387
ER  -

APA

Hatakeyama, T., & Sawada, K. (2026). Effect of accelerating voltages on indexing of SEM-EBSD via pattern matching. Ultramicroscopy. https://doi.org/10.1016/j.ultramic.2026.114387

Source records

crossref · retrieved 2026-09-25T17:55:18.847Z