Optically modulated free-electron computational ghost imaging for long-working-distance surface characterization.
- DOI
- 10.1016/j.ultramic.2026.114404
- Published
- 2026-06-06
- Container
- Ultramicroscopy
- Publisher
- Not recorded
- Open access
- no
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Cite this work
BibTeX
@article{allodium:10.1016/j.ultramic.2026.114404,
title = {Optically modulated free-electron computational ghost imaging for long-working-distance surface characterization.},
author = {Yu Z and Wang J and Yang S and Gao L and Liu S and Zhu J.},
year = {2026},
journal = {Ultramicroscopy},
doi = {10.1016/j.ultramic.2026.114404},
url = {https://doi.org/10.1016/j.ultramic.2026.114404}
}RIS
TY - JOUR TI - Optically modulated free-electron computational ghost imaging for long-working-distance surface characterization. AU - Yu Z AU - Wang J AU - Yang S AU - Gao L AU - Liu S AU - Zhu J. PY - 2026 JO - Ultramicroscopy DO - 10.1016/j.ultramic.2026.114404 UR - https://doi.org/10.1016/j.ultramic.2026.114404 ER -
APA
Z, Y., J, W., S, Y., L, G., S, L., & J., Z. (2026). Optically modulated free-electron computational ghost imaging for long-working-distance surface characterization.. Ultramicroscopy. https://doi.org/10.1016/j.ultramic.2026.114404
Source records
- europe-pmc · retrieved 2026-09-25T14:20:27.185Z