Event-sparse stack denoising for 4D-STEM applications.

Nordahl G, Klemmt R, Larsen MW, Bøjesen ED

DOI: 10.1016/j.ultramic.2026.114428
Published: 2026 Oct
Container: Ultramicroscopy
Publisher: Not recorded
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/j.ultramic.2026.114428,
  title = {Event-sparse stack denoising for 4D-STEM applications.},
  author = {Nordahl G and Klemmt R and Larsen MW and Bøjesen ED},
  year = {2026},
  journal = {Ultramicroscopy},
  doi = {10.1016/j.ultramic.2026.114428},
  url = {https://doi.org/10.1016/j.ultramic.2026.114428}
}

RIS

TY  - JOUR
TI  - Event-sparse stack denoising for 4D-STEM applications.
AU  - Nordahl G
AU  - Klemmt R
AU  - Larsen MW
AU  - Bøjesen ED
PY  - 2026
JO  - Ultramicroscopy
DO  - 10.1016/j.ultramic.2026.114428
UR  - https://doi.org/10.1016/j.ultramic.2026.114428
ER  -

APA

G, N., R, K., MW, L., & ED, B. (2026). Event-sparse stack denoising for 4D-STEM applications.. Ultramicroscopy. https://doi.org/10.1016/j.ultramic.2026.114428

Source records

pubmed · retrieved 2026-09-25T15:03:58.696Z