A variational method based post-processing framework for high-fidelity EBSD grain-detection refinement.
- DOI
- 10.1016/j.ultramic.2026.114443
- Published
- 2026 Aug 29
- Container
- Ultramicroscopy
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1016/j.ultramic.2026.114443,
title = {A variational method based post-processing framework for high-fidelity EBSD grain-detection refinement.},
author = {Zhang X and Zhao H and Gao J and Wu H and Zhang C and Huang Y and Lu J and Wang S and Mao X},
year = {2026},
journal = {Ultramicroscopy},
doi = {10.1016/j.ultramic.2026.114443},
url = {https://doi.org/10.1016/j.ultramic.2026.114443}
}RIS
TY - JOUR TI - A variational method based post-processing framework for high-fidelity EBSD grain-detection refinement. AU - Zhang X AU - Zhao H AU - Gao J AU - Wu H AU - Zhang C AU - Huang Y AU - Lu J AU - Wang S AU - Mao X PY - 2026 JO - Ultramicroscopy DO - 10.1016/j.ultramic.2026.114443 UR - https://doi.org/10.1016/j.ultramic.2026.114443 ER -
APA
X, Z., H, Z., J, G., H, W., C, Z., Y, H., J, L., S, W., & X, M. (2026). A variational method based post-processing framework for high-fidelity EBSD grain-detection refinement.. Ultramicroscopy. https://doi.org/10.1016/j.ultramic.2026.114443
Source records
- pubmed · retrieved 2026-09-26T00:56:19.452Z