Thickness determination from EDXS maps acquired in a transmission electron microscope and its application for shape reconstruction of nanoparticles
- DOI
- 10.1016/j.ultramic.2026.114466
- Published
- 2027-01
- Container
- Ultramicroscopy
- Publisher
- Elsevier BV
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1016/j.ultramic.2026.114466,
title = {Thickness determination from EDXS maps acquired in a transmission electron microscope and its application for shape reconstruction of nanoparticles},
author = {Radian Popescu and Dagmar Gerthsen and Simon Hettler and Martin Peterlechner and Erich Müller and Damien Hudry and Yolita Maria Eggeler},
year = {2027},
journal = {Ultramicroscopy},
doi = {10.1016/j.ultramic.2026.114466},
url = {https://doi.org/10.1016/j.ultramic.2026.114466}
}RIS
TY - JOUR TI - Thickness determination from EDXS maps acquired in a transmission electron microscope and its application for shape reconstruction of nanoparticles AU - Radian Popescu AU - Dagmar Gerthsen AU - Simon Hettler AU - Martin Peterlechner AU - Erich Müller AU - Damien Hudry AU - Yolita Maria Eggeler PY - 2027 JO - Ultramicroscopy DO - 10.1016/j.ultramic.2026.114466 UR - https://doi.org/10.1016/j.ultramic.2026.114466 ER -
APA
Popescu, R., Gerthsen, D., Hettler, S., Peterlechner, M., Müller, E., Hudry, D., & Eggeler, Y. M. (2027). Thickness determination from EDXS maps acquired in a transmission electron microscope and its application for shape reconstruction of nanoparticles. Ultramicroscopy. https://doi.org/10.1016/j.ultramic.2026.114466
Source records
- crossref · retrieved 2026-11-07T23:54:57.855Z