Protocol for DRIFT-EM: Direct wafer retrieval of ultrathin serial sections for volume electron microscopy

Joseph V. Gogola, Avryn Leo Justin, Gregg Wildenberg

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DOI: 10.1016/j.xpro.2026.104843
Published: 2026-12
Container: STAR Protocols
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/j.xpro.2026.104843,
  title = {Protocol for DRIFT-EM: Direct wafer retrieval of ultrathin serial sections for volume electron microscopy},
  author = {Joseph V. Gogola and Avryn Leo Justin and Gregg Wildenberg},
  year = {2026},
  journal = {STAR Protocols},
  doi = {10.1016/j.xpro.2026.104843},
  url = {https://doi.org/10.1016/j.xpro.2026.104843}
}

RIS

TY  - JOUR
TI  - Protocol for DRIFT-EM: Direct wafer retrieval of ultrathin serial sections for volume electron microscopy
AU  - Joseph V. Gogola
AU  - Avryn Leo Justin
AU  - Gregg Wildenberg
PY  - 2026
JO  - STAR Protocols
DO  - 10.1016/j.xpro.2026.104843
UR  - https://doi.org/10.1016/j.xpro.2026.104843
ER  -

APA

Gogola, J. V., Justin, A. L., & Wildenberg, G. (2026). Protocol for DRIFT-EM: Direct wafer retrieval of ultrathin serial sections for volume electron microscopy. STAR Protocols. https://doi.org/10.1016/j.xpro.2026.104843

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crossref · retrieved 2026-09-26T16:43:07.798Z