A device for measuring spectral reflectance on thin-layer plates with a zeiss spectrophotometer

L. de Galan, J. van Leeuwen, K. Camstra

Open source

DOI: 10.1016/s0003-2670(01)81694-9
Published: 1966
Container: Analytica Chimica Acta
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/s0003-2670-01-81694-9,
  title = {A device for measuring spectral reflectance on thin-layer plates with a zeiss spectrophotometer},
  author = {L. de Galan and J. van Leeuwen and K. Camstra},
  year = {1966},
  journal = {Analytica Chimica Acta},
  doi = {10.1016/s0003-2670(01)81694-9},
  url = {https://doi.org/10.1016/s0003-2670(01)81694-9}
}

RIS

TY  - JOUR
TI  - A device for measuring spectral reflectance on thin-layer plates with a zeiss spectrophotometer
AU  - L. de Galan
AU  - J. van Leeuwen
AU  - K. Camstra
PY  - 1966
JO  - Analytica Chimica Acta
DO  - 10.1016/s0003-2670(01)81694-9
UR  - https://doi.org/10.1016/s0003-2670(01)81694-9
ER  -

APA

Galan, L. D., Leeuwen, J. V., & Camstra, K. (1966). A device for measuring spectral reflectance on thin-layer plates with a zeiss spectrophotometer. Analytica Chimica Acta. https://doi.org/10.1016/s0003-2670(01)81694-9

Source records

crossref · retrieved 2026-11-10T14:55:40.278Z