Step-flow mechanism versus pit corrosion: scanning-tunneling microscopy observations on wet etching of Si(111) by HF solutions

H.E. Hessel, A. Feltz, M. Reiter, U. Memmert, R.J. Behm

Open source

DOI
10.1016/s0009-2614(91)85140-r
Published
1991-11
Container
Chemical Physics Letters
Publisher
Elsevier BV
Open access
unknown

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BibTeX

@article{allodium:10.1016/s0009-2614-91-85140-r,
  title = {Step-flow mechanism versus pit corrosion: scanning-tunneling microscopy observations on wet etching of Si(111) by HF solutions},
  author = {H.E. Hessel and A. Feltz and M. Reiter and U. Memmert and R.J. Behm},
  year = {1991},
  journal = {Chemical Physics Letters},
  doi = {10.1016/s0009-2614(91)85140-r},
  url = {https://doi.org/10.1016/s0009-2614(91)85140-r}
}

RIS

TY  - JOUR
TI  - Step-flow mechanism versus pit corrosion: scanning-tunneling microscopy observations on wet etching of Si(111) by HF solutions
AU  - H.E. Hessel
AU  - A. Feltz
AU  - M. Reiter
AU  - U. Memmert
AU  - R.J. Behm
PY  - 1991
JO  - Chemical Physics Letters
DO  - 10.1016/s0009-2614(91)85140-r
UR  - https://doi.org/10.1016/s0009-2614(91)85140-r
ER  - 

APA

Hessel, H., Feltz, A., Reiter, M., Memmert, U., & Behm, R. (1991). Step-flow mechanism versus pit corrosion: scanning-tunneling microscopy observations on wet etching of Si(111) by HF solutions. Chemical Physics Letters. https://doi.org/10.1016/s0009-2614(91)85140-r

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