A pragmatic methodology for the monitoring of the electronic components ageing: The case of power thyristors at EDF

G. Simon, G. Guffroy

Open source

DOI: 10.1016/s0026-2714(01)00200-1
Published: 2001-09
Container: Microelectronics Reliability
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/s0026-2714-01-00200-1,
  title = {A pragmatic methodology for the monitoring of the electronic components ageing: The case of power thyristors at EDF},
  author = {G. Simon and G. Guffroy},
  year = {2001},
  journal = {Microelectronics Reliability},
  doi = {10.1016/s0026-2714(01)00200-1},
  url = {https://doi.org/10.1016/s0026-2714(01)00200-1}
}

RIS

TY  - JOUR
TI  - A pragmatic methodology for the monitoring of the electronic components ageing: The case of power thyristors at EDF
AU  - G. Simon
AU  - G. Guffroy
PY  - 2001
JO  - Microelectronics Reliability
DO  - 10.1016/s0026-2714(01)00200-1
UR  - https://doi.org/10.1016/s0026-2714(01)00200-1
ER  -

APA

Simon, G., & Guffroy, G. (2001). A pragmatic methodology for the monitoring of the electronic components ageing: The case of power thyristors at EDF. Microelectronics Reliability. https://doi.org/10.1016/s0026-2714(01)00200-1

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crossref · retrieved 2026-09-26T01:33:14.580Z