1/fγ Noise separated from white noise with wavelet denoising

Lei Du, Yiqi Zhuang, Yong Wu

Open source

DOI: 10.1016/s0026-2714(01)00249-9
Published: 2002-02
Container: Microelectronics Reliability
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/s0026-2714-01-00249-9,
  title = {1/fγ Noise separated from white noise with wavelet denoising},
  author = {Lei Du and Yiqi Zhuang and Yong Wu},
  year = {2002},
  journal = {Microelectronics Reliability},
  doi = {10.1016/s0026-2714(01)00249-9},
  url = {https://doi.org/10.1016/s0026-2714(01)00249-9}
}

RIS

TY  - JOUR
TI  - 1/fγ Noise separated from white noise with wavelet denoising
AU  - Lei Du
AU  - Yiqi Zhuang
AU  - Yong Wu
PY  - 2002
JO  - Microelectronics Reliability
DO  - 10.1016/s0026-2714(01)00249-9
UR  - https://doi.org/10.1016/s0026-2714(01)00249-9
ER  -

APA

Du, L., Zhuang, Y., & Wu, Y. (2002). 1/fγ Noise separated from white noise with wavelet denoising. Microelectronics Reliability. https://doi.org/10.1016/s0026-2714(01)00249-9

Source records

crossref · retrieved 2026-09-26T10:14:25.439Z