Double shearography for engineering metrology: optical and digital approach

V.M. Murukeshan, Ng Chee Keong, Krishnakumar. V, Ong Lin Seng, A. Asundi

Open source

DOI: 10.1016/s0030-3992(01)00029-9
Published: 2001-07
Container: Optics & Laser Technology
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/s0030-3992-01-00029-9,
  title = {Double shearography for engineering metrology: optical and digital approach},
  author = {V.M. Murukeshan and Ng Chee Keong and Krishnakumar. V and Ong Lin Seng and A. Asundi},
  year = {2001},
  journal = {Optics \&amp; Laser Technology},
  doi = {10.1016/s0030-3992(01)00029-9},
  url = {https://doi.org/10.1016/s0030-3992(01)00029-9}
}

RIS

TY  - JOUR
TI  - Double shearography for engineering metrology: optical and digital approach
AU  - V.M. Murukeshan
AU  - Ng Chee Keong
AU  - Krishnakumar. V
AU  - Ong Lin Seng
AU  - A. Asundi
PY  - 2001
JO  - Optics &amp; Laser Technology
DO  - 10.1016/s0030-3992(01)00029-9
UR  - https://doi.org/10.1016/s0030-3992(01)00029-9
ER  -

APA

Murukeshan, V., Keong, N. C., V, K., Seng, O. L., & Asundi, A. (2001). Double shearography for engineering metrology: optical and digital approach. Optics & Laser Technology. https://doi.org/10.1016/s0030-3992(01)00029-9

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crossref · retrieved 2026-09-26T22:12:39.270Z