Spectral analysis for the effect of stylus tip curvature on measuring rough profiles

Jiunn-Jong Wu

Open source

DOI: 10.1016/s0043-1648(99)00109-x
Published: 1999-05
Container: Wear
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/s0043-1648-99-00109-x,
  title = {Spectral analysis for the effect of stylus tip curvature on measuring rough profiles},
  author = {Jiunn-Jong Wu},
  year = {1999},
  journal = {Wear},
  doi = {10.1016/s0043-1648(99)00109-x},
  url = {https://doi.org/10.1016/s0043-1648(99)00109-x}
}

RIS

TY  - JOUR
TI  - Spectral analysis for the effect of stylus tip curvature on measuring rough profiles
AU  - Jiunn-Jong Wu
PY  - 1999
JO  - Wear
DO  - 10.1016/s0043-1648(99)00109-x
UR  - https://doi.org/10.1016/s0043-1648(99)00109-x
ER  -

APA

Wu, J. (1999). Spectral analysis for the effect of stylus tip curvature on measuring rough profiles. Wear. https://doi.org/10.1016/s0043-1648(99)00109-x

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crossref · retrieved 2026-09-26T05:15:40.634Z