On measuring low-level self and relative saliency in photographic images

Jiebo Luo, Amit Singhal

Open source

DOI: 10.1016/s0167-8655(00)00070-2
Published: 2001-02
Container: Pattern Recognition Letters
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/s0167-8655-00-00070-2,
  title = {On measuring low-level self and relative saliency in photographic images},
  author = {Jiebo Luo and Amit Singhal},
  year = {2001},
  journal = {Pattern Recognition Letters},
  doi = {10.1016/s0167-8655(00)00070-2},
  url = {https://doi.org/10.1016/s0167-8655(00)00070-2}
}

RIS

TY  - JOUR
TI  - On measuring low-level self and relative saliency in photographic images
AU  - Jiebo Luo
AU  - Amit Singhal
PY  - 2001
JO  - Pattern Recognition Letters
DO  - 10.1016/s0167-8655(00)00070-2
UR  - https://doi.org/10.1016/s0167-8655(00)00070-2
ER  -

APA

Luo, J., & Singhal, A. (2001). On measuring low-level self and relative saliency in photographic images. Pattern Recognition Letters. https://doi.org/10.1016/s0167-8655(00)00070-2

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crossref · retrieved 2026-09-25T20:11:22.251Z