On-line testing for VLSI: state of the art and trends

Michael Nicolaidis

Open source

DOI: 10.1016/s0167-9260(98)00028-5
Published: 1998-12
Container: Integration
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/s0167-9260-98-00028-5,
  title = {On-line testing for VLSI: state of the art and trends},
  author = {Michael Nicolaidis},
  year = {1998},
  journal = {Integration},
  doi = {10.1016/s0167-9260(98)00028-5},
  url = {https://doi.org/10.1016/s0167-9260(98)00028-5}
}

RIS

TY  - JOUR
TI  - On-line testing for VLSI: state of the art and trends
AU  - Michael Nicolaidis
PY  - 1998
JO  - Integration
DO  - 10.1016/s0167-9260(98)00028-5
UR  - https://doi.org/10.1016/s0167-9260(98)00028-5
ER  -

APA

Nicolaidis, M. (1998). On-line testing for VLSI: state of the art and trends. Integration. https://doi.org/10.1016/s0167-9260(98)00028-5

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crossref · retrieved 2026-09-25T22:54:26.419Z