Characterisation of the BaTiO3/p-Si interface and applications

E.K. Evangelou, N. Konofaos, M.R. Craven, W.M. Cranton, C.B. Thomas

Open source

DOI: 10.1016/s0169-4332(00)00483-9
Published: 2000-10
Container: Applied Surface Science
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/s0169-4332-00-00483-9,
  title = {Characterisation of the BaTiO3/p-Si interface and applications},
  author = {E.K. Evangelou and N. Konofaos and M.R. Craven and W.M. Cranton and C.B. Thomas},
  year = {2000},
  journal = {Applied Surface Science},
  doi = {10.1016/s0169-4332(00)00483-9},
  url = {https://doi.org/10.1016/s0169-4332(00)00483-9}
}

RIS

TY  - JOUR
TI  - Characterisation of the BaTiO3/p-Si interface and applications
AU  - E.K. Evangelou
AU  - N. Konofaos
AU  - M.R. Craven
AU  - W.M. Cranton
AU  - C.B. Thomas
PY  - 2000
JO  - Applied Surface Science
DO  - 10.1016/s0169-4332(00)00483-9
UR  - https://doi.org/10.1016/s0169-4332(00)00483-9
ER  -

APA

Evangelou, E., Konofaos, N., Craven, M., Cranton, W., & Thomas, C. (2000). Characterisation of the BaTiO3/p-Si interface and applications. Applied Surface Science. https://doi.org/10.1016/s0169-4332(00)00483-9

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crossref · retrieved 2026-09-25T21:05:39.281Z