Atomic force microscopy with a conducting tip: correlation studies between microstructure and electrical properties of YBaCuO thin films

A.F. Dégardin, O. Schneegans, F. Houzé, É. Caristan, A. De Luca, P. Chrétien, L. Boyer, A.J. Kreisler

Open source

DOI
10.1016/s0921-4534(00)01128-x
Published
2000-11
Container
Physica C: Superconductivity
Publisher
Elsevier BV
Open access
unknown

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BibTeX

@article{allodium:10.1016/s0921-4534-00-01128-x,
  title = {Atomic force microscopy with a conducting tip: correlation studies between microstructure and electrical properties of YBaCuO thin films},
  author = {A.F. Dégardin and O. Schneegans and F. Houzé and É. Caristan and A. De Luca and P. Chrétien and L. Boyer and A.J. Kreisler},
  year = {2000},
  journal = {Physica C: Superconductivity},
  doi = {10.1016/s0921-4534(00)01128-x},
  url = {https://doi.org/10.1016/s0921-4534(00)01128-x}
}

RIS

TY  - JOUR
TI  - Atomic force microscopy with a conducting tip: correlation studies between microstructure and electrical properties of YBaCuO thin films
AU  - A.F. Dégardin
AU  - O. Schneegans
AU  - F. Houzé
AU  - É. Caristan
AU  - A. De Luca
AU  - P. Chrétien
AU  - L. Boyer
AU  - A.J. Kreisler
PY  - 2000
JO  - Physica C: Superconductivity
DO  - 10.1016/s0921-4534(00)01128-x
UR  - https://doi.org/10.1016/s0921-4534(00)01128-x
ER  - 

APA

Dégardin, A., Schneegans, O., Houzé, F., Caristan, É., Luca, A. D., Chrétien, P., Boyer, L., & Kreisler, A. (2000). Atomic force microscopy with a conducting tip: correlation studies between microstructure and electrical properties of YBaCuO thin films. Physica C: Superconductivity. https://doi.org/10.1016/s0921-4534(00)01128-x

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