Design for thermal testability (DfTT) and a CMOS realization

V. Székely, Cs. Márta, M. Rencz, Zs. Benedek, B. Courtois

Open source

DOI: 10.1016/s0924-4247(96)01246-0
Published: 1996-07
Container: Sensors and Actuators A: Physical
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/s0924-4247-96-01246-0,
  title = {Design for thermal testability (DfTT) and a CMOS realization},
  author = {V. Székely and Cs. Márta and M. Rencz and Zs. Benedek and B. Courtois},
  year = {1996},
  journal = {Sensors and Actuators A: Physical},
  doi = {10.1016/s0924-4247(96)01246-0},
  url = {https://doi.org/10.1016/s0924-4247(96)01246-0}
}

RIS

TY  - JOUR
TI  - Design for thermal testability (DfTT) and a CMOS realization
AU  - V. Székely
AU  - Cs. Márta
AU  - M. Rencz
AU  - Zs. Benedek
AU  - B. Courtois
PY  - 1996
JO  - Sensors and Actuators A: Physical
DO  - 10.1016/s0924-4247(96)01246-0
UR  - https://doi.org/10.1016/s0924-4247(96)01246-0
ER  -

APA

Székely, V., Márta, C., Rencz, M., Benedek, Z., & Courtois, B. (1996). Design for thermal testability (DfTT) and a CMOS realization. Sensors and Actuators A: Physical. https://doi.org/10.1016/s0924-4247(96)01246-0

Source records

crossref · retrieved 2026-11-09T16:03:04.594Z