Kelvin probe measurements of microcrystalline silicon on a nanometer scale using SFM
- DOI
- 10.1016/s0927-0248(00)00170-7
- Published
- 2001-02
- Container
- Solar Energy Materials and Solar Cells
- Publisher
- Elsevier BV
- Open access
- unknown
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uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
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Cite this work
BibTeX
@article{allodium:10.1016/s0927-0248-00-00170-7,
title = {Kelvin probe measurements of microcrystalline silicon on a nanometer scale using SFM},
author = {A Breymesser and V Schlosser and D Peiró and C Voz and J Bertomeu and J Andreu and J Summhammer},
year = {2001},
journal = {Solar Energy Materials and Solar Cells},
doi = {10.1016/s0927-0248(00)00170-7},
url = {https://doi.org/10.1016/s0927-0248(00)00170-7}
}RIS
TY - JOUR TI - Kelvin probe measurements of microcrystalline silicon on a nanometer scale using SFM AU - A Breymesser AU - V Schlosser AU - D Peiró AU - C Voz AU - J Bertomeu AU - J Andreu AU - J Summhammer PY - 2001 JO - Solar Energy Materials and Solar Cells DO - 10.1016/s0927-0248(00)00170-7 UR - https://doi.org/10.1016/s0927-0248(00)00170-7 ER -
APA
Breymesser, A., Schlosser, V., Peiró, D., Voz, C., Bertomeu, J., Andreu, J., & Summhammer, J. (2001). Kelvin probe measurements of microcrystalline silicon on a nanometer scale using SFM. Solar Energy Materials and Solar Cells. https://doi.org/10.1016/s0927-0248(00)00170-7
Source records
- crossref · retrieved 2026-09-26T19:46:29.422Z