A.C. scanning thermal microscopy: Tip–sample interaction and buried defects modellings

Séverine Gomès, Nathalie Trannoy, Françoise Depasse, Philippe Grossel

Open source

DOI: 10.1016/s1290-0729(00)00232-5
Published: 2000-04
Container: International Journal of Thermal Sciences
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/s1290-0729-00-00232-5,
  title = {A.C. scanning thermal microscopy: Tip–sample interaction and buried defects modellings},
  author = {Séverine Gomès and Nathalie Trannoy and Françoise Depasse and Philippe Grossel},
  year = {2000},
  journal = {International Journal of Thermal Sciences},
  doi = {10.1016/s1290-0729(00)00232-5},
  url = {https://doi.org/10.1016/s1290-0729(00)00232-5}
}

RIS

TY  - JOUR
TI  - A.C. scanning thermal microscopy: Tip–sample interaction and buried defects modellings
AU  - Séverine Gomès
AU  - Nathalie Trannoy
AU  - Françoise Depasse
AU  - Philippe Grossel
PY  - 2000
JO  - International Journal of Thermal Sciences
DO  - 10.1016/s1290-0729(00)00232-5
UR  - https://doi.org/10.1016/s1290-0729(00)00232-5
ER  -

APA

Gomès, S., Trannoy, N., Depasse, F., & Grossel, P. (2000). A.C. scanning thermal microscopy: Tip–sample interaction and buried defects modellings. International Journal of Thermal Sciences. https://doi.org/10.1016/s1290-0729(00)00232-5

Source records

crossref · retrieved 2026-09-26T09:27:43.569Z