Extended Depth of Field for High-Resolution Scanning Transmission Electron Microscopy

Robert Hovden, Huolin L. Xin, David A. Muller

Open source

DOI: 10.1017/s1431927610094171
Published: 2010-12-02
Container: Microscopy and Microanalysis
Publisher: Oxford University Press (OUP)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1017/s1431927610094171,
  title = {Extended Depth of Field for High-Resolution Scanning Transmission Electron Microscopy},
  author = {Robert Hovden and Huolin L. Xin and David A. Muller},
  year = {2010},
  journal = {Microscopy and Microanalysis},
  doi = {10.1017/s1431927610094171},
  url = {https://doi.org/10.1017/s1431927610094171}
}

RIS

TY  - JOUR
TI  - Extended Depth of Field for High-Resolution Scanning Transmission Electron Microscopy
AU  - Robert Hovden
AU  - Huolin L. Xin
AU  - David A. Muller
PY  - 2010
JO  - Microscopy and Microanalysis
DO  - 10.1017/s1431927610094171
UR  - https://doi.org/10.1017/s1431927610094171
ER  -

APA

Hovden, R., Xin, H. L., & Muller, D. A. (2010). Extended Depth of Field for High-Resolution Scanning Transmission Electron Microscopy. Microscopy and Microanalysis. https://doi.org/10.1017/s1431927610094171

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crossref · retrieved 2026-09-25T18:38:58.436Z