Determining on-axis crystal thickness with quantitative position-averaged incoherent bright-field signal in an aberration-corrected STEM.
- DOI
- 10.1017/s1431927612000189
- Published
- 2012 Aug
- Container
- Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1017/s1431927612000189,
title = {Determining on-axis crystal thickness with quantitative position-averaged incoherent bright-field signal in an aberration-corrected STEM.},
author = {Xin HL and Zhu Y and Muller DA},
year = {2012},
journal = {Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada},
doi = {10.1017/s1431927612000189},
url = {https://doi.org/10.1017/s1431927612000189}
}RIS
TY - JOUR TI - Determining on-axis crystal thickness with quantitative position-averaged incoherent bright-field signal in an aberration-corrected STEM. AU - Xin HL AU - Zhu Y AU - Muller DA PY - 2012 JO - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada DO - 10.1017/s1431927612000189 UR - https://doi.org/10.1017/s1431927612000189 ER -
APA
HL, X., Y, Z., & DA, M. (2012). Determining on-axis crystal thickness with quantitative position-averaged incoherent bright-field signal in an aberration-corrected STEM.. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. https://doi.org/10.1017/s1431927612000189
Source records
- pubmed · retrieved 2026-09-25T22:47:36.010Z