Optical Photothermal Infrared Microspectroscopy with Simultaneous Raman - A New Non-Contact Failure Analysis Technique for Identification of <10 μm Organic Contamination in the Hard Drive and other Electronics Industries.
- DOI
- 10.1017/s1551929520000917
- Published
- 2020 May
- Container
- Microscopy today
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.1017/s1551929520000917,
title = {Optical Photothermal Infrared Microspectroscopy with Simultaneous Raman - A New Non-Contact Failure Analysis Technique for Identification of <10 μm Organic Contamination in the Hard Drive and other Electronics Industries.},
author = {Kansiz M and Prater C and Dillon E and Lo M and Anderson J and Marcott C and Demissie A and Chen Y and Kunkel G},
year = {2020},
journal = {Microscopy today},
doi = {10.1017/s1551929520000917},
url = {https://doi.org/10.1017/s1551929520000917}
}RIS
TY - JOUR TI - Optical Photothermal Infrared Microspectroscopy with Simultaneous Raman - A New Non-Contact Failure Analysis Technique for Identification of <10 μm Organic Contamination in the Hard Drive and other Electronics Industries. AU - Kansiz M AU - Prater C AU - Dillon E AU - Lo M AU - Anderson J AU - Marcott C AU - Demissie A AU - Chen Y AU - Kunkel G PY - 2020 JO - Microscopy today DO - 10.1017/s1551929520000917 UR - https://doi.org/10.1017/s1551929520000917 ER -
APA
M, K., C, P., E, D., M, L., J, A., C, M., A, D., Y, C., & G, K. (2020). Optical Photothermal Infrared Microspectroscopy with Simultaneous Raman - A New Non-Contact Failure Analysis Technique for Identification of <10 μm Organic Contamination in the Hard Drive and other Electronics Industries.. Microscopy today. https://doi.org/10.1017/s1551929520000917
Source records
- pubmed · retrieved 2026-09-26T19:12:29.368Z