In Situ Process Control during Wet-Chemical Etching of Heteroepitaxial III-V Layers Using Reflection Anisotropy Spectroscopy.

Schmitt EA, Guidat M, Flieg M, Grutke J, Diecke M, Möller K, Euchner H, May MM

Open source

DOI
10.1021/acs.jpca.6c02573
Published
2026 Aug 13
Container
The journal of physical chemistry. A
Publisher
Not recorded
Open access
yes

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BibTeX

@article{allodium:10.1021/acs.jpca.6c02573,
  title = {In Situ Process Control during Wet-Chemical Etching of Heteroepitaxial III-V Layers Using Reflection Anisotropy Spectroscopy.},
  author = {Schmitt EA and Guidat M and Flieg M and Grutke J and Diecke M and Möller K and Euchner H and May MM},
  year = {2026},
  journal = {The journal of physical chemistry. A},
  doi = {10.1021/acs.jpca.6c02573},
  url = {https://doi.org/10.1021/acs.jpca.6c02573}
}

RIS

TY  - JOUR
TI  - In Situ Process Control during Wet-Chemical Etching of Heteroepitaxial III-V Layers Using Reflection Anisotropy Spectroscopy.
AU  - Schmitt EA
AU  - Guidat M
AU  - Flieg M
AU  - Grutke J
AU  - Diecke M
AU  - Möller K
AU  - Euchner H
AU  - May MM
PY  - 2026
JO  - The journal of physical chemistry. A
DO  - 10.1021/acs.jpca.6c02573
UR  - https://doi.org/10.1021/acs.jpca.6c02573
ER  - 

APA

EA, S., M, G., M, F., J, G., M, D., K, M., H, E., & MM, M. (2026). In Situ Process Control during Wet-Chemical Etching of Heteroepitaxial III-V Layers Using Reflection Anisotropy Spectroscopy.. The journal of physical chemistry. A. https://doi.org/10.1021/acs.jpca.6c02573

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