Quantifying Surfactant Adsorption at Fluid Interfaces by Combining X-ray Reflectivity and Simulations.

Dormann KR, Reed J, Shen C, Mitlewski D, Kanduč M, Liebchen B, Schneck E

Open source

DOI
10.1021/acs.langmuir.6c00422
Published
2026 Jun 16
Container
Langmuir : the ACS journal of surfaces and colloids
Publisher
Not recorded
Open access
no

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BibTeX

@article{allodium:10.1021/acs.langmuir.6c00422,
  title = {Quantifying Surfactant Adsorption at Fluid Interfaces by Combining X-ray Reflectivity and Simulations.},
  author = {Dormann KR and Reed J and Shen C and Mitlewski D and Kanduč M and Liebchen B and Schneck E},
  year = {2026},
  journal = {Langmuir : the ACS journal of surfaces and colloids},
  doi = {10.1021/acs.langmuir.6c00422},
  url = {https://doi.org/10.1021/acs.langmuir.6c00422}
}

RIS

TY  - JOUR
TI  - Quantifying Surfactant Adsorption at Fluid Interfaces by Combining X-ray Reflectivity and Simulations.
AU  - Dormann KR
AU  - Reed J
AU  - Shen C
AU  - Mitlewski D
AU  - Kanduč M
AU  - Liebchen B
AU  - Schneck E
PY  - 2026
JO  - Langmuir : the ACS journal of surfaces and colloids
DO  - 10.1021/acs.langmuir.6c00422
UR  - https://doi.org/10.1021/acs.langmuir.6c00422
ER  - 

APA

KR, D., J, R., C, S., D, M., M, K., B, L., & E, S. (2026). Quantifying Surfactant Adsorption at Fluid Interfaces by Combining X-ray Reflectivity and Simulations.. Langmuir : the ACS journal of surfaces and colloids. https://doi.org/10.1021/acs.langmuir.6c00422

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