Understanding Uncertainty and Error in Slip Length Measured by Atomic Force Microscopy (AFM).

Liu Z, Laaksonen A, Mu L, Zhu J, Lu X, Ji X

DOI: 10.1021/acs.langmuir.6c02267
Published: 2026 Jul 28
Container: Langmuir : the ACS journal of surfaces and colloids
Publisher: Not recorded
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1021/acs.langmuir.6c02267,
  title = {Understanding Uncertainty and Error in Slip Length Measured by Atomic Force Microscopy (AFM).},
  author = {Liu Z and Laaksonen A and Mu L and Zhu J and Lu X and Ji X},
  year = {2026},
  journal = {Langmuir : the ACS journal of surfaces and colloids},
  doi = {10.1021/acs.langmuir.6c02267},
  url = {https://doi.org/10.1021/acs.langmuir.6c02267}
}

RIS

TY  - JOUR
TI  - Understanding Uncertainty and Error in Slip Length Measured by Atomic Force Microscopy (AFM).
AU  - Liu Z
AU  - Laaksonen A
AU  - Mu L
AU  - Zhu J
AU  - Lu X
AU  - Ji X
PY  - 2026
JO  - Langmuir : the ACS journal of surfaces and colloids
DO  - 10.1021/acs.langmuir.6c02267
UR  - https://doi.org/10.1021/acs.langmuir.6c02267
ER  -

APA

Z, L., A, L., L, M., J, Z., X, L., & X, J. (2026). Understanding Uncertainty and Error in Slip Length Measured by Atomic Force Microscopy (AFM).. Langmuir : the ACS journal of surfaces and colloids. https://doi.org/10.1021/acs.langmuir.6c02267

Source records

pubmed · retrieved 2026-09-26T02:00:57.813Z