Nanoparticle Analysis for Reference Materials: The Small-Angle X-ray Scattering Method.

Thünemann AF

DOI: 10.1021/acs.langmuir.6c03792
Published: 2026 Oct 6
Container: Langmuir : the ACS journal of surfaces and colloids
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1021/acs.langmuir.6c03792,
  title = {Nanoparticle Analysis for Reference Materials: The Small-Angle X-ray Scattering Method.},
  author = {Thünemann AF},
  year = {2026},
  journal = {Langmuir : the ACS journal of surfaces and colloids},
  doi = {10.1021/acs.langmuir.6c03792},
  url = {https://doi.org/10.1021/acs.langmuir.6c03792}
}

RIS

TY  - JOUR
TI  - Nanoparticle Analysis for Reference Materials: The Small-Angle X-ray Scattering Method.
AU  - Thünemann AF
PY  - 2026
JO  - Langmuir : the ACS journal of surfaces and colloids
DO  - 10.1021/acs.langmuir.6c03792
UR  - https://doi.org/10.1021/acs.langmuir.6c03792
ER  -

APA

AF, T. (2026). Nanoparticle Analysis for Reference Materials: The Small-Angle X-ray Scattering Method.. Langmuir : the ACS journal of surfaces and colloids. https://doi.org/10.1021/acs.langmuir.6c03792

Source records

pubmed · retrieved 2026-11-10T14:56:38.645Z